SPIP 6.3.0

A powerful and professional analysis tool for microscopic images
SPIP is a comprehensive application that you can use to perform generic analysis on various types of input images from microscopes.

The program provides you with tools for analyzing SPM and SEM data, such as force curve analysis. It can detect environmental noise and correct it, as well as perform an overall characterization of the scanning probe.

For instance, you can use this application for enhancing the molecule contrast, curve analysis or generating histograms.

With its powerful analysis features and professional tools, SPIP represents a valuable and important utility for both research institutes and end users that are passionate about microelectronics or nanotechnology.

Main features:

  • Image calibration
  • Correlation averaging
  • Extended fourier analysis module
  • Roughness and hardness analysis
  • Tip characterization module
  • Filter module
  • Particle and pore analysis
  • 3D visualization studio
  • Force curve analysis
  • Time series analysis
  • Batch processing
  • Plugins

last updated on:
September 18th, 2014, 14:06 GMT
file size:
86.9 MB
developed by:
Image Metrology A/S
license type:
operating system(s):
Windows XP / Vista / 7 / 7 64 bit / 2003
C: \ Science / CAD


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9 Screenshots
SPIP - This is the main window of SPIP, where you can perform particle analysis and calibration tests.SPIP - From this tab of the program, you can open the Active Reporter and quick launch batch sequences.SPIP - You can add extra functionality to the application by using the available plugins.SPIPSPIPSPIPSPIPSPIPSPIP
What's New in This Release:
  • Shape Collections:
  • With the new Shape Collection feature you can accumulate the Particle & Pore Analysis results from many images into one large table and have statistics and all your favorite charts generated.
  • Collections can be saved to disk and opened again so that you can pause and continue your work as you desire.
read full changelog

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